Weisslicht Interferometer MicroProf 200

The MicroProf ® is the universal surface metrology tool for quick and easy determination of topography, film thickness and sample thickness.
The MicroProf ® works as an optical profilometer (2D)
as well as an imaging measuring instrument (3D)
by means of a scanning process or a direct imaging field of view sensor.
Roughness and waviness can be determined in 2D or 3D according to DIN EN ISO standards.
Easy operation and rapid utilization are the main features of the instrument.